2026-03-09T18:08:04Z https://chuo-u.repo.nii.ac.jp/oai

oai:chuo-u.repo.nii.ac.jp:00012405 2023-05-15T17:26:02Z 108:693

走査型レーザー照明を用いた位相差および暗視野照明顕微鏡の開発 Development of phase-contrast/dark-field microscopy with scanning laser illumination 佐藤, 毅 白根, 智崇 和田, 祐子 今井, 洋 上村, 慎治 この資料の著作権は、資料の著作者または学校法人中央大学に帰属します。著作権法が定める私的利用・引用を超える使用を希望される場合には、掲載誌発行部局へお問い合わせください。 application/pdf For the specimen illumination in conventional bright-field light microscopes, incoherent light sources such as halogen lamps or mercury tubes are used, but there is a certain limitation of image brightness as we cannot focus light source images in small spots. On the other hand, laser light sources with single wavelengths and parallel light path would be useful as we can focus for bright illumination. However, due to high speckle noise coming from complicated reflections on the surfaces of optical lenses and beam stops equipped inside microscope system, laser is almost useless for light sources. In this study, we designed a novel optics to scan laser light on the front focal plane of condenser lens, i.e., aperture plane, that is, with light sources placed optically at an optically infinite distance from specimens. Diatom standard specimens were used for the observation in both the phase contrast image and the dark field microscopy, and we could reduce speckle noise under applicable magnitude. Although we could not solve the problem of biased brightness of illumination depending on specimen angles, the new optics presented here is expected to be useful for the observation of fine structures with high image brightness. 中央大学理工学研究所 2020-03-31 jpn departmental bulletin paper VoR https://doi.org/10.24789/00012390 https://chuo-u.repo.nii.ac.jp/records/12405 10.24789/00012390 1343-0068 中央大学理工学研究所論文集 25 93 103 https://chuo-u.repo.nii.ac.jp/record/12405/files/1343-0068_25_93-103.pdf application/pdf 2.8 MB 2020-07-04