@article{oai:chuo-u.repo.nii.ac.jp:00012405,
 author = {佐藤, 毅 and 白根, 智崇 and 和田, 祐子 and 今井, 洋 and 上村, 慎治},
 journal = {中央大学理工学研究所論文集},
 month = {Mar},
 note = {application/pdf, For the specimen illumination in conventional bright-field light microscopes, incoherent light sources such as halogen lamps or mercury tubes are used, but there is a certain limitation of image brightness as we cannot focus light source images in small spots. On the other hand, laser light sources with single wavelengths and parallel light path would be useful as we can focus for bright illumination. However, due to high speckle noise coming from complicated reflections on the surfaces of optical lenses and beam stops equipped inside microscope system, laser is almost useless for light sources. In this study, we designed a novel optics to scan laser light on the front focal plane of condenser lens, i.e., aperture plane, that is, with light sources placed optically at an optically infinite distance from specimens. Diatom standard specimens were used for the observation in both the phase contrast image and the dark field microscopy, and we could reduce speckle noise under applicable magnitude. Although we could not solve the problem of biased brightness of illumination depending on specimen angles, the new optics presented here is expected to be useful for the observation of fine structures with high image brightness.},
 pages = {93--103},
 title = {走査型レーザー照明を用いた位相差および暗視野照明顕微鏡の開発},
 volume = {25},
 year = {2020}
}