{"created":"2023-09-13T08:39:08.476152+00:00","id":2000132,"links":{},"metadata":{"_buckets":{"deposit":"37e021b1-4447-4eef-852e-5cd7f8b9640e"},"_deposit":{"created_by":8,"id":"2000132","owners":[8],"pid":{"revision_id":0,"type":"depid","value":"2000132"},"status":"published"},"_oai":{"id":"oai:chuo-u.repo.nii.ac.jp:02000132","sets":["442:1694589335845"]},"author_link":[],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2023-02-28","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"42","bibliographicPageEnd":"113","bibliographicPageStart":"97","bibliographic_titles":[{"bibliographic_title":"企業研究","bibliographic_titleLang":"ja"}]}]},"item_10002_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":" We systematically review the recent literature on patent fees and deferred patent examination system. By reviewing the recent literature, we elaborate shortcomings of the extant research on patent fees and deferred patent examination system. At the same time, we provide future directions for research.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"企業研究所","subitem_publisher_language":"ja"}]},"item_10002_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"この資料の著作権は、資料の著作者または学校法人中央大学に帰属します。著作権法が定める私的利用・引用を超える使用を希望される場合には、掲載誌発行部局へお問い合わせください。","subitem_rights_language":"ja"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1347-9938","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"西村,陽一郎","creatorNameLang":"ja"},{"creatorName":"ニシムラ,ヨウイチロウ"},{"creatorName":"NISHIMURA,Yoichiro"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","fileDate":[{"fileDateType":"Issued"}],"filename":"1347-9938-42-06.pdf","mimetype":"application/pdf","url":{"url":"https://chuo-u.repo.nii.ac.jp/record/2000132/files/1347-9938-42-06.pdf"},"version_id":"8ec3e38b-0b63-4182-b564-13c2b3a5d116"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Patent fees","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Deferred patent examination system","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Literature review","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"特許料金および特許審査請求制度に関する研究の現状と課題","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"特許料金および特許審査請求制度に関する研究の現状と課題","subitem_title_language":"ja"},{"subitem_title":"Patent Fees and Deferred Patent Examination System : A Literature Review and Future Directions","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"8","path":["1694589335845"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2023-09-13"},"publish_date":"2023-09-13","publish_status":"0","recid":"2000132","relation_version_is_last":true,"title":["特許料金および特許審査請求制度に関する研究の現状と課題"],"weko_creator_id":"8","weko_shared_id":-1},"updated":"2023-09-14T04:30:01.472969+00:00"}